BeamMap2 Description：

Product Manual Datasheet Drawing

DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time scanning slit system uses XY slit pairs in multiple Z planes on a rotating puck to simultaneously measure four beam profiles at four different Z locations. The BeamMap2’s unique design is most advantageous for real-time measurement of focus position, M2, beam divergence, and pointing.

Key Features

Multiple detector options covering 190 to 2500 nm

190 to 1150 nm, Silicon detector

650 to 1800 nm, InGaAs detector

1800 to 2300/2500 nm, InGaAs (extended) detector

ISO compliant beam diameter measurements

Port-powered USB 2.0

Auto-gain function

Optional stage accessory for ISO 11146- compliant M2 measurements

True2D? slits

Resolution to 0.1 μm

5 Hz update rate (adjustable 2 to 10 Hz)

Profile CW/Quasi-CW beams

Beam diameters 5 μm to 4 mm

Multiple z-plane scanning

XYZ profiles, plus θ-Φ

Focus position and diameter

Real-time M2, pointing, and divergence measurements

Identify focus with ±1 μm repeatability (beam dependent)

Example Applications

Very small laser beam profiling

Optical assembly and instrument alignment

OEM integration

Lens focal length testing

Real-time diagnosis of focusing and alignment errors

Real-time setting of multiple assemblies to the same focus

M2 measurement with available M2DU stage

True2D? Slits

0.4 μm thick metallic multilayer films on a sapphire substrate

Mutliple advantages over air slits

Avoid tunnel effect

Air slits are typically deeper than they are wide, and can buckle under high irradiance

Specification